Provides full hot-swap automation for GEN3 PCIe SDD drives. The module has full control over power, data (dual port) and present pins, allowing simulation of any possible hot-swap scenario.

Individual control of each signal, pin bounce and high speed glitching combine to greatly increase the number of test cases you can perform.

Drive modules can be used individually for simple bench testing, or multiple units can be used to automate an entire storage enclosure.